Advantest debuts analog IC and memory test systems Advantest has introduced its 266-MHz T5782 memory test system for MCP/flash devices and memory-embedded microcontrollers, and its Advantest Kyushu Systems subsidiary has announced the ADS1911 test system low-pin-count analog devices.
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Solution Sources Programming (SSP), a company specializing in programming and test for ICT, x-ray laminography, bench boundary scan, and functional test stations, has added an Agilent Medalist i3070 ICT (in-circuit test) system to its test floor to increase capacity.
The Isoprobe III probes have a coaxial connecting cable with low capacitance, which produces a low input capacitance and rapid rise times when combined with changes to the interior of the probe.
The iVista LC high-resolution digital microscope from SUSS Micro Tec provides failure-analysis labs with a microscopy tool capable of delivering high-resolution digital images in conjunction with laser-cutting capabilities.
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ROWE'S AND COLUMNS Martin Rowe, Senior Technical Editor, Test & Measurement World November 5, 2008 Technical articles retain value
I'm always amazed, and pleased, when I hear from readers who still find value in old ... More
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T&MW senior technical editor Martin Rowe is handy with guitar chords, and he has written several songs that pay tribute to engineers: