T&MW Announces Award Winners
Grachanen, Willtek honored at ceremony
-- Test & Measurement World, 2/25/2004
FEBRUARY 24, 2004--During a ceremony held this evening in conjunction with the 2004 APEX conference in Anaheim, CA, Test & Measurement World magazine announced the recipients of several test industry awards. The highlight of the evening was the announcement that Christopher Grachanen has been named the Test Engineer of the Year. Grachanen, who is manager of the metrology laboratory at Hewlett-Packard in Houston, TX, was introduced to the gathering of test industry professionals by Larry Maloney, publisher of T&MW. Rick Nelson, T&MW's executive editor, presented Grachanen with a
medal, and Eric Starkloff of National Instruments (the company that
sponsored the award) presented him with a plaque.
 |
|
Eric
Starkloff (left) and Rick Nelson (center) |
As the Test Engineer of the Year, Grachanen was given the opportunity to designate engineering programs to receive a total of $20,000 in education grants, courtesy of National Instruments. (Look for a profile of Grachanen in the March 2004 issue of Test & Measurement World.)
Also during the awards ceremony, Maloney announced the winner of the 2004 Test Product of the Year: The Willtek 9101 handheld spectrum analyzer. Russ Byrd, VP of North American Operations for Willtek, accepted the award plaque from Nelson.
 |
| Rick Nelson (left) presents the Test Product of the Year Award to Russ Byrd of Willtek |
Prior to announcing Willtek as the Test Product of the Year, Maloney introduced the entire slate of Best in Test Award winners, and Nelson presented a plaque to a representative of each company:
- Sapphire NP SOC tester, NPTest (Rudy Garcia, Technical Advisor and Marketing Manager)
- WBI-FOX precision x-ray inspection system, Feinfocus (Lance Scott, President)
- CVS-1454 Compact Vision System, National Instruments (Eric Starkloff, Platform Manager for PXI and Modular Instruments)
- EmiScope-II diagnostic system, Optonics, a Credence Co. (Israel Nir, President)
- PT100 parallel tester, Intellitech (C.J. Clark, CEO)
- E2960 Series PCI Express protocol analyzers, Agilent Technologies (Thomas Mattes, Product Manager)
- Arendar Test Data Management software, VI Technology, (Chris Neil, Senior Engineer)
- GX7100 3U/6U combination PXI chassis, Geotest-Marvin Test Systems (David Manor, VP of Engineering)
- PowerDNA distributed data-acquisition system, United Electronic Industries
- DL7400 Series digital oscilloscopes, Yokogawa Corp. of America (Gary Gartman, Western Regional Manager)
- Model 3117 double-ridged waveguide horn antenna, ETS-Lindgren
- 9101 4-GHz handheld spectrum analyzer, Willtek (Russ Byrd, VP of North American Operations)
This is the 14th year that Test & Measurement World has conducted the Best in Test Awards program. We are already accepting nominations for next year's awards. To learn more, visit the Best in Test page on our Web site.
Complete APEX Coverage |
