The best of both worlds

A Web-exclusive companion piece to "To mux or not to mux?" from our November 2006 issue.

Alan Albee, Teradyne -- Test & Measurement World, 11/1/2006

You needn’t commit to a full pure-pin or full multiplexed approach when choosing an in-circuit test system. Teradyne, for example, offers as part of its UltraPin II technology both types of in-circuit testers on compatible platforms so you can select the technology that best meets your budget, pin-count, and development requirements. The common pin technology, software, and fixture interfaces found in the multiplexed and non-multiplexed systems permit easy program and fixture migration as well as scalability to meet changing in-circuit test requirements.

UltraPin II features per-pin programmable logic assignments and slew rates, bidirectional drivers, and dual-level sensors. It also includes real-time back-drive current measurement capabilities. During debug, this capability allows you to identify faulty program and design issues (eliminating the need to use a storage oscilloscope). During production, the measurement can pinpoint faulty enable pins and output drivers and protect the board under test from overstress conditions.