InFlip MEMS strip-test module
2007 Best in Test: MEMS TEST
By Staff -- Test & Measurement World, 12/1/2006
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Awards overview |
Multitest, www.multitest.com
A member of Multitest’s InMEMS product line, the InFlip MEMS strip-test module for three-axis low-g accelerometers incorporates a modular architecture designed to replace expensive custom-designed machinery. Convertible to support various MEMS applications and packages, the module can operate in a stand-alone mode in an engineering bench setup, or it can be configured with a Multitest InStrip platform for full automation.
The InFlip module can handle panels and lead frames ranging from 20x150 mm to 65x225 mm. It supports tests over the –40°C to +150°C temperature range. Access rotation velocity is approximately 180° per second. Index time is 0.5 s; strip exchange time is 9 s.
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2007 Best in Test Award Winners
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