The Best in Test-2007

Our technical editors have chosen the 2007 Best in Test award winners. Now you can vote online for the Test Product of the Year.

Staff -- Test & Measurement World, 12/1/2006

Awards overview Honorable mentions Online ballot Dec/Jan Table of Contents

Each year, Test & Measurement World’s editors present the Best in Test awards to products we think are particularly innovative or useful. Here, we present the 2007 Best in Test winners as well as 24 products worthy of honorable mention. T&MW’s editors narrowed this year’s field from scores of deserving products, nominated by vendors, that were introduced between November 1, 2005, and October 31, 2006.

You can help determine which of the 12 Best in Test products will become the Test Product of the Year. Simply click on the links below to read about each winner and then go to our online ballot and cast your vote by January 26, 2007. We will announce the winning product in February and will publish a story about it in our March 2007 issue.

Deadline for voting: January 26, 2007

---

2007 Best in Test Award Winners 

DIGITAL MULTIMETERS
8846A digital multimeter, Fluke

AUDIO TEST
APx585 audio tester, Audio Precision

WAVEFORM GENERATORS
AWG7000 series arbitrary waveform generators, Tektronix

DATA-ACQUISITION
CompactDaq USB-based data-acquisition system, National Instruments

RF/MICROWAVE TEST
FSUP signal source analyzer, Rohde & Schwarz

OSCILLOSCOPES
Infiniium 80000B series oscilloscopes, Agilent Technologies

MEMS TEST
InFlip MEMS strip-test module, Multitest

PROBING SYSTEMS
M150 Measurement Platform, Cascade Microtech

AUTOMATED OPTICAL INSPECTION
OptiCon BasicLine 1M/4M AOI system, Goepel electronic

WIRELINE COMMUNICATIONS
Spirent Protocol Tester, Spirent Communications

BOARD TEST
TapCommunicator boundary-scan interface, JTAG Technologies

SEMICONDUCTOR TEST
Test Management Solutions software, OptimalTest

---

Go to the online ballot

Talkback

We would love your feedback!

Post a comment

» VIEW ALL TALKBACK THREADS

Related Content

• Topics
• Author

Related Content

 

By This Author

• Wafer-inspection system handles 45-nm lithography
• AOI system inspects PCB assemblies
• 3-D metrology system boasts high precision
• X-ray system recognizes submicron features
• AXI system offers programmable angle-shot capability
• » MORE

Sponsored Links