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T&MW announces winners of 2007 industry awards

-- Test & Measurement World, 2/22/2007 2:38:00 PM

See photos from the ceremony.

Guest speaker Doug Raymond, VP of Measurement and Instrumentation at Frost & Sullivan, discussed the prospects for the test-equipment industry. See his presentation,
Frost & Sullivan's Global Test Outlook for 2007

During a ceremony held February 21 in Los Angeles, CA, Test & Measurement World announced the recipients of its annual test-industry awards that honor excellence in both engineering and product development.

Russ Pratt, publisher of Test & Measurement World, announced to the gathering that John Gmitter, lead test engineer at Harris RF Communications, has been selected the 2007 Test Engineer of the Year by a vote of T&MW's readers. The Test Engineer of the Year award acknowledges the contributions that test engineers make to the electronics industry. We profiled the six finalists in our September 2006 issue and asked readers to cast their votes using our online ballot.


John Gmitter

Gmitter, who manages a team charged with developing test stations that support his company's high-volume manufacturing of tactical communications equipment, was unable to attend the ceremony, but he accepted the award through a video presentation. As part of the award, Gmitter has designated Monroe Community College to receive a $30,000 engineering grant, courtesy of award sponsors Agilent Technologies, Keithley Instruments, and National Instruments. (Read our profile of Gmitter, "Test for the digital battlefield.")


The recipients of the Best in Test awards posed together after receiving their plaques.

Chief editor Rick Nelson next presented plaques to the manufacturers of the 12 products that had won 2007 Best in Test awards. The annual Best in Test awards, which we first presented in 1991, honor important and innovative new products and services in the electronics test and measurement industry. The winners are chosen by our editorial staff and cover a range of technology areas, including data acquisition, audio test, inspection, and semiconductor test. We first announced the 12 winners of the 2007 awards in our December/January issue and had asked readers to choose among them and vote for the Test Product of the Year.

Our readers selected the Agilent Infiniium 80000B oscilloscopes as the winner. Nelson presented the Test Product of the Year award to Jun Chie, marketing manager, and Mike Karin, R&S manager of the


Russ Pratt (l) and Rick Nelson (r) stand with Mike Karin and Jun Chie, who accepted the Test Product of the Year award for Agilent Technologies' Inifiniium 80000B family of oscillscopes.

company's oscilloscope business unit. (See also, "High-bandwidth scope takes the prize.")

Nelson also announced the recipient of the 2007 Test of Time award. The Test of Time award, which we inaugurated at our 2005 awards ceremony, recognizes a product that continues to provide state-of-the-art performance at least five years after its introduction. For the 2007 award, our editors chose a product that recently celebrated its 20th anniversary: National Instruments' LabView software. Richard McDonell, group manager, PXI and Instrument Control, accepted the award from Nelson. (See also, "Graphical programming for test and measurement.")

You can learn more about the T&MW awards program and previous winners at www.tmworld.com/awards.

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