Detect PCB defects on power, ground pins
By Staff -- Test & Measurement World, 4/1/2007
The Agilent Medalist VTEP v2.0 suite of vectorless test techniques includes a new network parameter measurement technology, which allows users to detect opens on power and ground pins on connectors. Targeting applications having PCI Express, DDR, and SATA connectors, the VTEP v2.0 technology maximizes signal integrity while limiting bit-error rate (BER) and radiated electromagnetic interference (EMI).
VTEP v2.0 preserves the original VTEP vectorless-test technology as well as iVTEP, which is targeted at ultra-small integrated circuit packages with minimal or no lead frames. VTEP v2.0 employs the same hardware as the original VTEP; therefore, no hardware upgrade is required.
Base price: free on all Agilent Medalist i3070 systems and to existing Agilent in-circuit test customers holding software-upgrade contracts. Agilent Technologies, www.agilent.com/see/vtep.
