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Test & Measurement World - May 01, 2006
Features
Image of perfection: Bringing up chips at IBM
A line-up of probe systems, emission microscopes, and other image-based tools helps engineers optimize processes and processors for IBM Microelectronics' 300-mm fab.
Roll a million miles
IPTV: Video's latest test frontier
Ethernet vs. Camera Link
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Time for D-Link to own up
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A global reach for AOI technology
Machine-Vision and Inspection Test Report
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A product for every taste
Highlights
Market study shows positive outlook
Agilent AOI system validates component placement
Basler launches camera lines
Machine-Vision and Inspection Report
Agilent looks at inspection trends
Thermal imaging maps device heat dissipation
Data Matrix codes demand proper lighting
Products
Three-chip camera eases system integration
IR camera has broad spectral response
Library works with machine-vision software
Software hones x-ray image inspection
Product Update
Featured Products
Mix and match modules in USB data-acquisition system
Chart recorder monitors up to 18 process sensors
Temperature loggers record data on eight channels
8-bit PCI digitizer acquires 250 Msamples/s
AC/DC supplies permit plug-and-play customization
Fixed-distance slot sensors available in six widths
Service monitor features color display
ScanFlex available for in-circuit testers
A half rack of switch modules, please
Portable signal generator offers multiple options
Audio analyzer teams with programming applications
Probe holder remains stable despite high or low temperatures
1-kVA power source works with electrical safety analyzers
Tech Trends
Bench-Level Test
Here come the lawyers
Manufacturing Test
Electrons get faster
Test Digest
Book Review
Getting the dope on nanotechnology
Circuit Analysis
Deriving Thevenin equivalents
EMI Standard
EMI standard planned for replaceable modules
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